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/* SPDX-License-Identifier: BSD-2-Clause */
/*
* Copyright (c) 2014, STMicroelectronics International N.V.
*/
#ifndef CORE_PTA_TESTS_MISC_H
#define CORE_PTA_TESTS_MISC_H
#include <compiler.h>
#include <tee_api_types.h>
#include <tee_api_defines.h>
/* basic run-time tests */
TEE_Result core_self_tests(uint32_t nParamTypes,
TEE_Param pParams[TEE_NUM_PARAMS]);
TEE_Result core_fs_htree_tests(uint32_t nParamTypes,
TEE_Param pParams[TEE_NUM_PARAMS]);
TEE_Result core_mutex_tests(uint32_t nParamTypes,
TEE_Param pParams[TEE_NUM_PARAMS]);
#ifdef CFG_LOCKDEP
TEE_Result core_lockdep_tests(uint32_t nParamTypes,
TEE_Param pParams[TEE_NUM_PARAMS]);
#else
static inline TEE_Result core_lockdep_tests(
uint32_t nParamTypes __unused,
TEE_Param pParams[TEE_NUM_PARAMS] __unused)
{
return TEE_ERROR_NOT_SUPPORTED;
}
#endif
#endif /*CORE_PTA_TESTS_MISC_H*/