| /* SPDX-License-Identifier: BSD-2-Clause */ |
| /* |
| * Copyright (c) 2014, STMicroelectronics International N.V. |
| */ |
| #ifndef CORE_PTA_TESTS_MISC_H |
| #define CORE_PTA_TESTS_MISC_H |
| |
| #include <compiler.h> |
| #include <tee_api_types.h> |
| #include <tee_api_defines.h> |
| |
| /* basic run-time tests */ |
| TEE_Result core_self_tests(uint32_t nParamTypes, |
| TEE_Param pParams[TEE_NUM_PARAMS]); |
| |
| TEE_Result core_fs_htree_tests(uint32_t nParamTypes, |
| TEE_Param pParams[TEE_NUM_PARAMS]); |
| |
| TEE_Result core_mutex_tests(uint32_t nParamTypes, |
| TEE_Param pParams[TEE_NUM_PARAMS]); |
| |
| #ifdef CFG_LOCKDEP |
| TEE_Result core_lockdep_tests(uint32_t nParamTypes, |
| TEE_Param pParams[TEE_NUM_PARAMS]); |
| #else |
| static inline TEE_Result core_lockdep_tests( |
| uint32_t nParamTypes __unused, |
| TEE_Param pParams[TEE_NUM_PARAMS] __unused) |
| { |
| return TEE_ERROR_NOT_SUPPORTED; |
| } |
| #endif |
| |
| #endif /*CORE_PTA_TESTS_MISC_H*/ |